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Hong, Yang David, Yeow, YewTong, Chim, Wai Kin, Yan, Jian and Wong, Kin Mun (2006) Accurate Modeling of the Effects of Fringing Area Interface Traps on Scanning Capacitance Microscopy Measurement. IEEE Transactions on Electron Devices, 53 3: 499-506. doi:10.1109/TED.2005.864367 431 198 1 Cited 1 times in Scopus1 0
Hong, Yang David, Yeow, Yew Tong, Chim, Wai-Kin, Wong, Kin-Mun and Kopanski, Joseph J. (2004) Influence of Interface Traps and Surface Mobility Degradation on Scanning Capacitance Microscopy Measurement. IEEE Transactions on Electron Devices, 51 9: 1496-1503. doi:10.1109/ted.2004.833590 310 290 7 Cited 8 times in Scopus8 0