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Li, F. H., Fan, Y. L., Yang, X. J., Jiang, Z. M., Wu, Q. and Zou, J. (2006) Atomic composition profile change of SiGe islands during Si capping. Applied Physics Letters, 89 10: 103108-1-103108-3. doi:10.1063/1.2345589 66   13 Cited 12 times in Scopus12 0
Tang, C.Y., Li, F.H., Wang, R., Zou, J., Zheng, X.H. and Liang, J.W. (2007) Atomic configurations of dislocation core and twin boundaries in 3C-SiC studied by high-resolution electron microscopy. Physical Review B, 75 18: 184103-1-184103-7. doi:10.1103/PhysRevB.75.184103 129   11 Cited 8 times in Scopus8 0
Zou, J., Li, F.H., Yang, D.Y., Jiang, Y.D. and Kuo, K.H. (1988) A transmission electron-microscopy study on metastable phases in the li2o-tio2 system. Philosophical Magazine B-physics of Condensed Matter Statistical Mechanics Electronic Optical And Magnetic Properties, 57 1: 103-110. doi:10.1080/13642818808205726 54   4 0
Wang, D., Zou, J., He, W. Z., Chen, H., Li, F. H., Kawasaki, K. and Oikawa, T. (2004) Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM. Ultramicroscopy, 98 2-4: 259-264. doi:10.1016/j.ultramic.2003.08.019 64   15 Cited 11 times in Scopus11 0
Jiang, Z. M., Li, F. H., Lin, J. H., Wu, R., Wu, Y. Q. and Zou, J. (2007). Faceted SiGe quantum dots and their stabilities. In: Proceedings of the Material Today Asia, 2007. Materials Today Asia, 2007, Beijing, China, (x-x). 3 - 5 September, 2007. 45  
Qin, J., Li, F. H., Wu, Y. Q., Yang, H. B., Fan, Y. L. and Jiang, Z. M. (2007) Mechanism for coarsening of P-mediated Ge quantum dots during in-situ annealing. Surface Science, 601 4: 941-944. doi:10.1016/j.susc.2006.11.034 44   9 Cited 8 times in Scopus8 0
Wen, C., Wang, Y.M., Wan, W., Li, F.H., Liang, J.W. and Zou, J. (2009) Nature of interfacial defects and their roles in strain relaxation at highly lattice mismatched 3C-SiC/Si (001) interface. Journal of applied physics, 106 7: 073522-1-073522-8. doi:10.1063/1.3234380 95   13 Cited 8 times in Scopus8 0
Tang, D., Teng, C.M., Zou, J. and Li, F. H. (1986) Pseudo-weak-phase-object approximation in high-resolution electron microscopy. II. Feasibility of directly observing Li+. Acta Crystallographica. Section B: Structural Science, 42 4: 340-342. doi:10.1107/S0108768186098130 35   13 0
Wu, Y. Q., Li, F. H., Cui, J., Wu, R., Qin, J., Zhu, C. Y., Fan, Y. L., Yang, X. J. and Jiang, Z. M. (2005) Shape change of SiGe islands with initial Si capping. Applied Physics Letters, 87 22: 223116-1-223116-3. doi:10.1063/1.2137307 48   22 Cited 21 times in Scopus21 0
Wu, Y. Q., Zou, J., LI, F. H., Lin, J. H., Wu, R. W. and Jiang, Z. M. (2006). The stability of faceted SiGe quantum dotes capped with a Si thin layer. In: 16th International Microscopy Congress. 16th International Microscopy Congress, Sapporo, Japan, (1337). 3-8 September, 2006. 54