Browse by all authors Browse By Author Name - Li,+F.H.

Browse Results (10 results found)

Subscribe to the RSS feed for this result setSubscribe to the RSS feed for this result set

  Abstract Views File Downloads Thomson Reuters Web of Science Citation Count Scopus Citation Count Altmetric Score
Li, F. H., Fan, Y. L., Yang, X. J., Jiang, Z. M., Wu, Q. and Zou, J. (2006) Atomic composition profile change of SiGe islands during Si capping. Applied Physics Letters, 89 10: 103108-1-103108-3. doi:10.1063/1.2345589 71   13 Cited 12 times in Scopus12 0
Tang, C.Y., Li, F.H., Wang, R., Zou, J., Zheng, X.H. and Liang, J.W. (2007) Atomic configurations of dislocation core and twin boundaries in 3C-SiC studied by high-resolution electron microscopy. Physical Review B, 75 18: 184103-1-184103-7. doi:10.1103/PhysRevB.75.184103 134 3 12 Cited 13 times in Scopus13 0
Zou, J., Li, F.H., Yang, D.Y., Jiang, Y.D. and Kuo, K.H. (1988) A transmission electron-microscopy study on metastable phases in the li2o-tio2 system. Philosophical Magazine B-physics of Condensed Matter Statistical Mechanics Electronic Optical And Magnetic Properties, 57 1: 103-110. doi:10.1080/13642818808205726 57   4 0
Wang, D., Zou, J., He, W. Z., Chen, H., Li, F. H., Kawasaki, K. and Oikawa, T. (2004) Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM. Ultramicroscopy, 98 2-4: 259-264. doi:10.1016/j.ultramic.2003.08.019 66   16 Cited 13 times in Scopus13 0
Jiang, Z. M., Li, F. H., Lin, J. H., Wu, R., Wu, Y. Q. and Zou, J. (2007). Faceted SiGe quantum dots and their stabilities. In: Proceedings of the Material Today Asia, 2007. Materials Today Asia, 2007, Beijing, China, (x-x). 3 - 5 September, 2007. 47  
Qin, J., Li, F. H., Wu, Y. Q., Yang, H. B., Fan, Y. L. and Jiang, Z. M. (2007) Mechanism for coarsening of P-mediated Ge quantum dots during in-situ annealing. Surface Science, 601 4: 941-944. doi:10.1016/j.susc.2006.11.034 46   9 Cited 8 times in Scopus8 0
Wen, C., Wang, Y.M., Wan, W., Li, F.H., Liang, J.W. and Zou, J. (2009) Nature of interfacial defects and their roles in strain relaxation at highly lattice mismatched 3C-SiC/Si (001) interface. Journal of applied physics, 106 7: 073522-1-073522-8. doi:10.1063/1.3234380 97   14 Cited 14 times in Scopus14 0
Tang, D., Teng, C.M., Zou, J. and Li, F. H. (1986) Pseudo-weak-phase-object approximation in high-resolution electron microscopy. II. Feasibility of directly observing Li+. Acta Crystallographica. Section B: Structural Science, 42 4: 340-342. doi:10.1107/S0108768186098130 38   13 0
Wu, Y. Q., Li, F. H., Cui, J., Wu, R., Qin, J., Zhu, C. Y., Fan, Y. L., Yang, X. J. and Jiang, Z. M. (2005) Shape change of SiGe islands with initial Si capping. Applied Physics Letters, 87 22: 223116-1-223116-3. doi:10.1063/1.2137307 50   23 Cited 21 times in Scopus21 0
Wu, Y. Q., Zou, J., LI, F. H., Lin, J. H., Wu, R. W. and Jiang, Z. M. (2006). The stability of faceted SiGe quantum dotes capped with a Si thin layer. In: 16th International Microscopy Congress. 16th International Microscopy Congress, Sapporo, Japan, (1337). 3-8 September, 2006. 57