Browse by all authors Browse By Author Name - Lau,+M.+P.

Browse Results (3 results found)

Subscribe to the RSS feed for this result setSubscribe to the RSS feed for this result set

  Abstract Views File Downloads Thomson Reuters Web of Science Citation Count Scopus Citation Count Altmetric Score
Hsu, C. T., Lau, M. P., Yeow, T. Y. T. and Yao, Z. Q. (2000). Analysis of hot-carrier-induced degradation in MOSFET's by gate-to-drain and gate-to-substrate capacitance measurements. In: W R Tonti, 2000 IEEE International Reliability Physics Symposium Proceedings 38th Annual. 38th Annual International Reliability Physics Symposium, San Jose, (98-102). 10-13 April 2000. 51  
Lau, M. P., Hsu, C. T. and Yeow, T.Y.T. (2001). Investigations of hot-carrier induced interface damages via small-signal characteristics of drain-to-substrate gated-diode. In: W. Tan, K, Pey, W. Chim and J. Thong, Proceedings of the 2001 Eighth International Symposium on the Physical and Failure Analysis of Integrated Circuits. Eighth International Symposium on the Physical and Failure Analysis of Integrated Circuits, Singapore, (249-253). 9-13 July, 2001. doi:10.1109/IPFA.2001.941496 56   3 0
Lau, M. P., Chiang, Y., Yeow, Y. T. and Yao, Z. Q. (1999). Measurement of VT and Leff using MOSFET gate-substrate capacitance. In: Proceedings of the 1999 International Conference on Microelectronic Test Structures. ICMTS'99, Goteborg, (152-155). 15-18 March 1999. 54