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Hsu, C. T., Lau, M. M. and Yeow, Y. T. (2001) Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs. Microelectronics Reliability, 41 2: 201-209. doi:10.1016/S0026-2714(00)00222-5 83   5 Cited 5 times in Scopus5 0
Lau, M. M., Chiang, C. Y. T., Yeow, Y. T. and Yao, Z. Q. (2001) A new method of threshold voltage extraction via MOSFET gate-to-substrate capacitance measurement. Ieee Transactions On Electron Devices, 48 8: 1742-1744. doi:10.1109/16.936698 127   7 Cited 7 times in Scopus7 0